STS Series Semiconductor Static Parameter Test System
Professional Test System Empowering Semiconductor Device Innovation
Wide Range
Micro-Measurement
In the field of semiconductor testing, GreenTest Technology is consistently dedicated to providing professional testing solutions for the research, development, and production of semiconductor devices. The STS Series Semiconductor Static Parameter Test System is a specialized testing platform designed specifically for characterizing semiconductor components such as MOSFETs and IGBTs, offering comprehensive testing support throughout the entire process—from parameter validation to reliability evaluation.
The STS Series Semiconductor Static Parameter Test System can measure all relevant device parameters under a wide range of operating conditions, including breakdown voltage, on-resistance, as well as IV parameters such as three-terminal FET capacitance, gate charge, and power dissipation.
Output range ±210V/±10.5A (pulse), minimum resolution 100nV/10fA. (Customizable)
Frequency range 1kHz-1MHz, capacitance measurement range 100fF-1μF. (Customizable)
Equipped with socket adapters to prevent connection errors for plug-in devices. (Customizable)
| Model | STS6001 | ||
|---|---|---|---|
| Collector/Drain Channel | Maximum Output | Voltage | DC±210V |
| Current | DC±3.03A | ||
| Pulse±10.5A | |||
Minimum Resolution | Source | 100nV*1/10fA*1 | |
| Measurement | 100nV*1/10fA*1 | ||
| Gate Channel | Maximum Output | Voltage | DC±210V |
| Current | DC±3.03A | ||
| Pulse±10.5A | |||
| Minimum Resolution | Source | 100nV*1/10fA*1 | |
| Measurement | 100nV*1/10fA*1 | ||
| Capacitance Measurement | Maximum Bias Voltage | Collector/Drain/Gate | ±210V |
| Frequency Range | 1kHz-1MHz | ||
| Capacitance Range | 100fF-1μF | ||
| Operating Range | IV Function | Collector/Drain Voltage | DC±210V |
| Collector/Drain Current | DC±3.03A | ||
| Pulse±10.5A | |||
| Gate | DC±210V/±3.03A | ||
| Pulse±210V/±10.5A | |||
| CV Function | Collector/Drain/Gate DC Bias Voltage | ±210V | |
| Frequency | 1kHz-1MHz | ||
| Capacitance | 100fF-100nF | ||
| Gate Charge Function | Qg, Qgd, Qd | 1nC-100μC | |
| VDD | 210V | ||
| ID | 10.5A | ||
| Gate Drive | ±30V | ||
*1. Requires optional SMU module.
The STS Series Semiconductor Static Parameter Test System is designed around the dual dimensions of "functional modules + testing capabilities", ensuring intuitive and efficient operation while achieving comprehensive test coverage. The system, paired with IVCVQG test fixtures and SemiWorks host computer testing software, enables multi-dimensional testing capabilities to meet the full lifecycle testing needs of semiconductor devices from R&D to mass production.
Features a wide range of voltage and current (optional, up to 3kV and 1500A).
Current measurement down to below nanoampere levels.
The IVCVQG test fixture integrates a fully automatic test switching circuit, capable of performing high-voltage and high-current tests as well as switching between IV and CV measurements.
Provides full-process testing support, from parameter verification to reliability evaluation.
