SemiWorks 3.0 Semiconductor Static Parameter Testing Software
Efficient, Consistent, Stable
Provides a complete circuit design solution
Extensive device parameter testing from static characteristics, gate charge characteristics to power loss.
The SemiWorks semiconductor static parameter testing software supports the measurement of all relevant device parameters under a wide range of operating conditions, including breakdown voltage, on-resistance, as well as IV parameters such as three-terminal FET capacitance, gate charge, and power dissipation.
SemiWorks helps power circuit designers select the most suitable semiconductor devices, thereby enhancing product performance.
Provides a complete circuit design solution
Extensive device parameter testing from static characteristics, gate charge characteristics to power loss.
Paired with the STS Series Semiconductor Static Parameter Test System and IVCVQG test fixture to achieve one-click automated testing.
Supports testing of all IV, gate charge, capacitance, switching characteristics, and power loss parameters.
Compatible with testing devices such as MOSFETs, IGBTs, BJTs, and Diodes.
Single software controls all test equipment, including the test fixture.
Provides visual operation steps and test process guidance, simple and intuitive.
Supports custom limits for the device under test for subsequent PASS/FAIL judgment.
Test data and logs refresh in real-time, supporting display in tables, curves, etc., and providing error alarm functions.
Test data/reports can be exported to various formats such as Word, PDF, Excel, CSV.
Suitable for testing and characterization of three-pin/two-pin semiconductor packaged devices or wafer-level devices.
On-Board Chargers, Charging Piles, Energy Storage Converters, etc.
High-voltage, high-current performance testing..., meeting the demands for increased range and fast charging.
Frequency Converters, Servo Drives, Motor Drive Systems, etc.
High-frequency switching characteristics, overload protection testing..., supporting the precision and efficient operation of industrial equipment.
Packaged Devices, Wafer-Level Devices, etc.
Breakdown voltage test, leakage current test, on-resistance test..., ensuring process stability.
| Characteristic | Category | Parameters |
|---|---|---|
| Static Characteristics | Threshold Voltage | Vgs(th), Vge(th) |
| Transfer Characteristics | Id-Vgs, Ic-Vge, gfs | |
| On-Resistance | Rds-on, Vce(sat) | |
| Gate Leakage Current | Igss, Iges | |
| Output Leakage Current | Idss, Ices | |
| Output Characteristics | Id-Vds, Ic-Vce | |
| Breakdown Voltage | BVds, BVces | |
| Gate Charge Characteristics | Gate Charge | Qg, Qg(th), Qgs, Qgd, Qsw, Qsync, Qoss |
| Capacitance Characteristics | Gate Resistance | Rg |
| Device Capacitance | Ciss, Coss, Coss_eff, Crss, Cgs, Cgd, Cies, Coes, Cres | |
| Switching Characteristics | Switching Parameters | Td(on), Td(off), Tr, Tf*1 |
| Power Loss | Power Loss Parameters | Drive Loss/Switching Loss*2 Conduction Loss at Specific Duty Cycle*3 |
*1. Switching parameters are calculated from measured Qg characteristics, Vth, and Rg.
*2. Drive loss and switching loss are calculated from measured Qg characteristics at a specific frequency, Vth, and Rg.
*3. Conduction loss is calculated from measured on-resistance and peak current.
• Import/Export
Supports importing and exporting test configurations in Json format.
• Multi-Type Switching Test
Built-in multiple DUT types, providing characteristic parameter and characteristic graph testing.
• Limit Setting
Supports setting upper and lower limits for the DUT, with customizable voltage, current, and temperature test conditions.
• Test Status Display
Indicates "Running", "Pass", "Fail" test status with color codes.
• PASS/FAIL Judgment
Supports PASS/FAIL judgment on measured values, with results indicated by color.
• Single-Step Test Run
Supports custom test sequences, allowing single-step/continuous execution of test sequences.
• Test Charts
Supports measuring and logging test data, and mapping out test waveforms.
• Test Data
Supports real-time display of test data summary tables; data can be stored in a database.
• Test Logs
Test logs refresh in real-time, supporting alarms for test anomalies and errors.
